• Optical Instruments
  • Vol. 41, Issue 5, 76 (2019)
Tian TANG, Jie XU, Xin WANG, and Baozhong MU
Author Affiliations
  • School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • show less
    DOI: 10.3969/j.issn.1005-5630.2019.05.012 Cite this Article
    Tian TANG, Jie XU, Xin WANG, Baozhong MU. Study of X-ray backscatter system based on flying-spot scanning[J]. Optical Instruments, 2019, 41(5): 76 Copy Citation Text show less
    References

    [1] CHALMERS A. Transmissionenhanced backscatter Xray images[C]Proceedings of SPIE 4507, hard Xray gammaray detect physics III. San Diego, CA, United States: SPIE, 2001: 125 – 131.

    [3] CHALMERS A. Rapid inspection of cargos at ptals using drivethrough transmission backscatter Xray imaging[C]Proceedings of SPIE 5403, senss, comm, control, communications, intelligence (C3I) technologies f homel security homel defense III. lo, Flida, United States: SPIE, 2004.

    [4] CHALMERS A. Three applications of backscatter xray imaging technology to homel defense[C]Proceedings of SPIE 5778, senss, comm, control, communications, intelligence (C3I) technologies f homel security homel defense IV. lo, Flida, United States: SPIE, 2005: 989 – 993.

    [7] NIKL M. Scintillation detectors for X-rays[J]. Measurement Science and Technology, 17, R37-R54(2006).