• Acta Optica Sinica
  • Vol. 38, Issue 9, 0927001 (2018)
Ran Zeng1、2、*, Jinxin Hou1, Chi Wang1, Qiliang Li1, Meihua Bi1, Guowei Yang1, and Yaping Yang2
Author Affiliations
  • 1 School of Communication Engineering, Hangzhou Dianzi University, Hangzhou, Zhejiang 310018, China
  • 2 Key Laboratory of Advanced Micro-Structured Materials of Ministry of Education, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
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    DOI: 10.3788/AOS201838.0927001 Cite this Article Set citation alerts
    Ran Zeng, Jinxin Hou, Chi Wang, Qiliang Li, Meihua Bi, Guowei Yang, Yaping Yang. Spontaneous Emission Characteristics of Atoms near Topological Insulator Slab with Finite Thickness[J]. Acta Optica Sinica, 2018, 38(9): 0927001 Copy Citation Text show less

    Abstract

    The spontaneous emission properties of the two-level atoms placed near a topological insulator (TI) slab with a finite thickness or inside its cavity are investigated. The spontaneous emission rates of the dipole parallel or perpendicular to the material boundary are expressed via the dyadic Green function. The reflection matrix of this slab is calculated based on the multiple reflection theory, and the various factors which influence the spontaneous emission rate are numerically calculated and analyzed. The research results show that, when the dissipation is ignored, the spontaneous emission rate of the parallel dipole is suppressed, however, that of the perpendicular dipole is enhanced. When the dissipation of the slab or its cavity is included, the TI can effectively suppress the spontaneous emission rate of the atoms and make all of the decays of atoms near it along any diploe directions suppressed.
    Ran Zeng, Jinxin Hou, Chi Wang, Qiliang Li, Meihua Bi, Guowei Yang, Yaping Yang. Spontaneous Emission Characteristics of Atoms near Topological Insulator Slab with Finite Thickness[J]. Acta Optica Sinica, 2018, 38(9): 0927001
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