Junxiu Chang, Yuan Zhao, Guohang Hu, Yueliang Wang, Dawei Li, Xiaofeng Liu, Jianda Shao. Characterization of inclusions in KD2PO4 crystals[J]. Chinese Optics Letters, 2015, 13(8): 081601
- Chinese Optics Letters
- Vol. 13, Issue 8, 081601 (2015)
Fig. 1. (a) Submicron-scale and (b) micron-scale defects in DKDP crystal detected by the light-scattering technique.
Fig. 2. Morphology of submicron-scale inclusion in the DKDP crystal observed by the TEM.
Fig. 3. The EDS result of the submicron-scale inclusion in the DKDP crystal.
Fig. 4. Morphology of the micron-scale inclusion in the DKDP crystal observed by the microscope PM6000.
Fig. 5. The result of the TOF-SIMS analysis. (a) The distribution of Na + Na +
Fig. 6. R-on-1 laser damage probability curve of the DKDP samples.
Fig. 7. Pinpoint damage initiated by the micron-scale inclusion in the DKDP crystal.
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Table 1. The Mass Contents of Main Impurity Elements in the KH2PO4 Raw Material
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