Yan-Zhen LIU, Shu-Jie LI, Ying-Xu ZHANG, Yong-Gang XIN, Zhi-Hua LI, Yang LIN, Xiong-Jun LI, Qiang QIN, Jun JIANG, Jian-Hua GUO. Analysis and control of abnormal phenomena in HgCdTe surface treatment[J]. Journal of Infrared and Millimeter Waves, 2023, 42(2): 149
- Journal of Infrared and Millimeter Waves
- Vol. 42, Issue 2, 149 (2023)
Fig. 1. Three typical microscopic images of water mark defects
Fig. 2. High-resolution XPS spectra of elements with water mark defect（a），（b），（c），and normal area（d），（e），（f）
Fig. 3. （a）Typical microscopic images of staining，（b）the response diagram，（c）the D* diagram，and（d）the noise diagram
Fig. 4. XPS high-resolution spectrum of Br 3d（a），C 1s（b），and C 1s（conductive adhesive）（c）
Fig. 5. （a）Typical microscopic images of round spot，（b）the response diagram，and（c）the the number of pixels contained in the circular dark spot（a small square represents a pixel）
Fig. 6. Typical microscopic images of round spot（a）and the SEM image of material defect（b）
Fig. 7. XPS high-resolution spectrum of Br 3d（a）and C 1s（b）
Fig. 8. Typical microscopic images and SEM images of normal area（a），（b），and over-roughness area（c），（d）
Fig. 9. SEM images of samples after CdTe film removed for normal area（a）and over-roughness area（b）
Fig. 10. SEM images of the sample without toluene immersion（a）the surface of HgCdTe，（b）the surface of CdTe，（c）the section structure of CdTe/HgCdTe，and the sample with toluene immersion（d）the surface of HgCdTe，（e）the surface of CdTe，（f）the section structure of CdTe/HgCdTe
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Table 1. The proportion of samples with water mark defects under different experimental conditions
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Table 2. The composition at different region
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