• Infrared and Laser Engineering
  • Vol. 46, Issue 11, 1103004 (2017)
Yang Jing1、*, Wu Sijin1, Zheng Weiwei2, Li Weixian1, and Yang Lianxiang3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla201746.1103004 Cite this Article
    Yang Jing, Wu Sijin, Zheng Weiwei, Li Weixian, Yang Lianxiang. Full-field measurement of micro strain of printed circuit board assembly using digital image correlation[J]. Infrared and Laser Engineering, 2017, 46(11): 1103004 Copy Citation Text show less
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    [8] Shi Hongbin, Ikezawa Satoshi, Ueda Toshitsugu. A novel method for evaluating triaxial strain gages used in printed circuit board assemblies (PCBA) strain monitoring [C]//Sensors, 2011 IEEE, 2011: 1697-1700.

    [9] Huang Chienyi, Ying Kuoching. Applying strain gauges to measuring thermal warpage of printed circuit boards [J]. Measurement, 2017, 110: 239-248.

    [10] Shi Hongbin, Wu Jinchang, Zhang Jing. Selection methodology study of strain gages for printed circuit board strain measurement [J]. Printed Circuit Information, 2009(9): 30-35. (in Chinese)

    [11] Wang Yonghong, Dan Xizuo, Li Junrui, et al. Multi-perspective digital image correlation method using a single color camera [J]. Science China Technological Sciences, 2017, 60: 1-7.

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    Yang Jing, Wu Sijin, Zheng Weiwei, Li Weixian, Yang Lianxiang. Full-field measurement of micro strain of printed circuit board assembly using digital image correlation[J]. Infrared and Laser Engineering, 2017, 46(11): 1103004
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