• Laser & Optoelectronics Progress
  • Vol. 57, Issue 24, 241009 (2020)
Pengyong Xue1、*, Yong He1、2、*, Renhui Guo1、2, Jianxin Li1、2, and Haifei Xu1
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
  • 2Key Laboratory of Advanced Solid Laser Industry and Information Technology Ministry, Nanjing, Jiangsu 210094, China
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    DOI: 10.3788/LOP57.241009 Cite this Article Set citation alerts
    Pengyong Xue, Yong He, Renhui Guo, Jianxin Li, Haifei Xu. Calculation of Local Fringe Direction in Moiré Patterns Based on Phase Fitting[J]. Laser & Optoelectronics Progress, 2020, 57(24): 241009 Copy Citation Text show less
    References

    [1] Nakano Y, Murata K. Measurements of phase objects using the Talbot effect and moire techniques[J]. Applied Optics, 23, 2296-2299(1984). http://www.opticsinfobase.org/ao/abstract.cfm?uri=ao-23-14-2296

    [2] Bhattacharya J C. Talbot interferometry in the measurement of the refractive indices of a doubly refracting crystal[J]. Applied Optics, 40, 1658-1662(2001).

    [3] Zhao W, Li Z, Qiu L et al. Large-aperture laser differential confocal ultra-long focal length measurement and its system[J]. Optics Express, 23, 17379-17393(2015).

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    [7] He F, Bai J, Hou X Y. Calibration method for angular measurement of Moiré patterns based on template matching[J]. Infrared and Laser Engineering, 44, 2825-2830(2015).

    [8] Gu T M. Research on the surface diopter of progressive multifocal lens[D]. Nanjing: Nanjing University of Science and Technology, 39-45(2016).

    [9] Canabal H, Quiroga J A, Bernabeu E. Automatic processing in moiré deflectometry by local fringe direction calculation[J]. Applied Optics, 37, 5894-5901(1998).

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    [11] Singh P, Faridi M S, Shakher C et al. Measurement of focal length with phase-shifting Talbot interferometry[J]. Applied Optics, 44, 1572-1576(2005).

    Pengyong Xue, Yong He, Renhui Guo, Jianxin Li, Haifei Xu. Calculation of Local Fringe Direction in Moiré Patterns Based on Phase Fitting[J]. Laser & Optoelectronics Progress, 2020, 57(24): 241009
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