• Spectroscopy and Spectral Analysis
  • Vol. 41, Issue 7, 2148 (2021)
He-xi WU1、*, Run-jie DI2、2;, Yu-juan LIU1、1; 2;, Hui XU2、2;, and Yi-bao LIU2、2; *;
Author Affiliations
  • 11. Engineering Research Center of Nuclear Technology Application (East China University of Technology), Ministry of Education, Nanchang 330013, China
  • 22. School of Nuclear Science and Engineering, East China University of Technology, Nanchang 330013, China
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    DOI: 10.3964/j.issn.1000-0593(2021)07-2148-05 Cite this Article
    He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148 Copy Citation Text show less
    References

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    [3] F Meirer, G Pepponi, P Pianetta, A Singh et al. TrAC Trends in Analytical Chemistry, 29, 479(2010).

    [5] Jianbin Zhou, Wei Zhou, Jiarong Lei et al. Nuclear Science and Techniques, 23, 150(2012).

    [6] Bin Tang, Zhuodai Li, Huaiqiang Zhang et al. Nuclear Science and Techniques, 30, 108(2019).

    [7] Liangquan Ge, Qing Ge, Hongwen Yuan et al. Nuclear Science and Techniques, 26, 010402(2015).

    [8] Huaiqiang Zhang, Bin Tang, Liangquan Ge et al. Nuclear Science and Techniques, 24, 060407(2013).

    He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148
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