• Spectroscopy and Spectral Analysis
  • Vol. 41, Issue 7, 2148 (2021)
He-xi WU1、*, Run-jie DI2、2;, Yu-juan LIU1、1; 2;, Hui XU2、2;, and Yi-bao LIU2、2; *;
Author Affiliations
  • 11. Engineering Research Center of Nuclear Technology Application (East China University of Technology), Ministry of Education, Nanchang 330013, China
  • 22. School of Nuclear Science and Engineering, East China University of Technology, Nanchang 330013, China
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    DOI: 10.3964/j.issn.1000-0593(2021)07-2148-05 Cite this Article
    He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148 Copy Citation Text show less
    Principle and prototype of TXRF spectrometer
    Fig. 1. Principle and prototype of TXRF spectrometer
    Fitting curve and transform results under different k values with straight-line shaper of a digital nuclear pulse
    Fig. 2. Fitting curve and transform results under different k values with straight-line shaper of a digital nuclear pulse
    Transform results of a series of digital nuclear pulse with different shaper
    Fig. 3. Transform results of a series of digital nuclear pulse with different shaper
    Fitting results of rising edge of digital nuclear pulse transformed with straight-line shaper
    Fig. 4. Fitting results of rising edge of digital nuclear pulse transformed with straight-line shaper
    Relationship between amplitude fitting values by double exponential function and amplitude extraction values transformed with straight-line shaper of digital nuclear pulse
    Fig. 5. Relationship between amplitude fitting values by double exponential function and amplitude extraction values transformed with straight-line shaper of digital nuclear pulse
    Processing diagram of handling digital nuclear pulse in FPGA
    Fig. 6. Processing diagram of handling digital nuclear pulse in FPGA
    Measured spectrums of Fe film with TXRF spectrometer
    Fig. 7. Measured spectrums of Fe film with TXRF spectrometer
    测量模式能量分辨
    率/eV
    峰背比和峰计数
    率/cps
    模拟式能谱测量系统140.21±1.276.87±0.36196.1±21.8
    梯形成形(b=T, d=15T)135.47±0.6520.82±0.1721.2±0.28
    直线成形方法132.98±0.5324.36±0.1215.4±0.24
    Table 1. Performance comparison of different measurement model
    He-xi WU, Run-jie DI, Yu-juan LIU, Hui XU, Yi-bao LIU. Application on Straight-Line Shaping Method for Energy Spectrum Measurement in TXRF Spectrometer Based on SDD Detector[J]. Spectroscopy and Spectral Analysis, 2021, 41(7): 2148
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