A fast defect-detecting method for smooth hemispherical shell surface

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 10 >Page 32 > Article

Opto-Electronic Engineering
Vol. 31, Issue 10, 32 (2004)

A fast defect-detecting method for smooth hemispherical shell surface

[in Chinese]¹, [in Chinese]², [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32 Copy Citation Text

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References

[4] LE J,GUO J J,ZHU H,et al.Automatic Defect-detection for Inside and Outside Surfaces of Hemispherical Shell[A].Proc.of ISIST'2002:Part 4 [C].Harbin:Harbin Institute of Technology Press,2002.79-84.

[5] ZHENG J Y,FUKAGAWA Y,ABE N.3D Surface Estimation and Model Construction from Specular Motion[J].IEEE Trans.on Pattern Analysis and Machine Intelligence,1997,19(5):513-520.

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32

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