A fast defect-detecting method for smooth hemispherical shell surface

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 10 >Page 32 > Article

Opto-Electronic Engineering
Vol. 31, Issue 10, 32 (2004)

A fast defect-detecting method for smooth hemispherical shell surface

[in Chinese]¹, [in Chinese]², [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32

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