jingjing Shi, Yadong Hu, Mengfan Li, Wuhao Liu, Jin Hong. Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation[J]. Acta Optica Sinica, 2022, 42(2): 0212003
- Acta Optica Sinica
- Vol. 42, Issue 2, 0212003 (2022)
Fig. 1. Block diagram of SM polarization measurement system
Fig. 2. Simulation of spectral modulation process. (a) Normalization parameters of incident linear polarized light; (b) simulation curve of modulation spectrum
Fig. 3. Influence of spectral broadening on modulation spectrum. (a) Comparison of original modulation spectrum and convolved spectrum; (b) curve of polarimetric efficiency
Fig. 4. Schematic diagram of experimental set-up
Fig. 5. Calibration site of relative response coefficient
Fig. 6. Spectra of dual-channel unpolarized light
Fig. 7. Original spectrum of 0° reference linear polarized light
Fig. 8. Modulation function of 0° reference linear polarized light. (a) Modulation function; (b) fitting residual error
Fig. 9. Retardation of multiple-order wave plate
Fig. 10. Polarimetric efficiency of 0° reference linear polarized light
Fig. 11. Polarimetric efficiency of system
Fig. 12. Experiment site for polarization measurement accuracy verification of system
Fig. 13. Theoretical outputs and measurement results of VPOLS. (a) Original spectra; (b) modulation function; (c) measurement error of AoLP; (d) measurement value of DoLP and its error
Fig. 14. Measurement results when VPOLS rotation angle is 38.3°. (a) DoLP varying with wavelength; (b) AoLP error varying with wavelength
Fig. 15. Measurement results when VPOLS rotation angle is 59.0°. (a) DoLP varying with wavelength; (b) AoLP error varying with wavelength
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Table 1. Error statistics between measured value and theoretical value
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