Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation

jingjing Shi; Yadong Hu; Mengfan Li; Wuhao Liu; Jin Hong

doi:10.3788/AOS202242.0212003

Journals >Acta Optica Sinica >Volume 42 >Issue 2 >Page 0212003 > Article

Acta Optica Sinica
Vol. 42, Issue 2, 0212003 (2022)

Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation

jingjing Shi^1、2, Yadong Hu^2、*, Mengfan Li², Wuhao Liu^1、2, and Jin Hong^1、2

Author Affiliations

¹School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei, Anhui 230026, China

²Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China

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DOI: 10.3788/AOS202242.0212003 Cite this Article Set citation alerts

jingjing Shi, Yadong Hu, Mengfan Li, Wuhao Liu, Jin Hong. Research and Accuracy Verification of Linear Polarization Measurement Technology Based on Spectral Modulation[J]. Acta Optica Sinica, 2022, 42(2): 0212003 Copy Citation Text

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