The basic principle of image processing methods based on variational image decomposition, the common functional spaces, and the variational image decomposition models are introduced. We review the applications of information extraction technologies based on variational image decomposition for electronic speckle pattern interferometry (ESPI) in recent years, including the filtering process, orientation and density calculation, and skeleton line extraction of the fringes. The advantages of the mentioned methods compared with that of traditional methods are given and the development trend of the image processing methods based on variational image decomposition in optical measurement is further illustrated.