• Acta Optica Sinica
  • Vol. 38, Issue 2, 0204002 (2018)
Houzhi Cai1, Jinyuan Liu1, Wenyong Fu1, Yunfei Lei1, Yubo Liao1, and Jinghua Long2、*
Author Affiliations
  • 1 Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen, Guangdong 518060, China
  • 2 College of Physics and Energy, Shenzhen University, Shenzhen, Guangdong 518060, China
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    DOI: 10.3788/AOS201838.0204002 Cite this Article Set citation alerts
    Houzhi Cai, Jinyuan Liu, Wenyong Fu, Yunfei Lei, Yubo Liao, Jinghua Long. Measurement Technology of Time of Flight Based on Gated Microchannel Plates[J]. Acta Optica Sinica, 2018, 38(2): 0204002 Copy Citation Text show less
    TOF measurement system based on gated MCP technology. (a) Structural diagram; (b) photograph
    Fig. 1. TOF measurement system based on gated MCP technology. (a) Structural diagram; (b) photograph
    Schematic of output end array of fiber bunch
    Fig. 2. Schematic of output end array of fiber bunch
    Experimental setup of TOF measurement
    Fig. 3. Experimental setup of TOF measurement
    Measurement results of TOF
    Fig. 4. Measurement results of TOF
    Relationship between TOF of electrons and electron energy
    Fig. 5. Relationship between TOF of electrons and electron energy
    Static image of fiber
    Fig. 6. Static image of fiber
    Dynamic image of fiber
    Fig. 7. Dynamic image of fiber
    Measurement results of time resolution
    Fig. 8. Measurement results of time resolution
    Houzhi Cai, Jinyuan Liu, Wenyong Fu, Yunfei Lei, Yubo Liao, Jinghua Long. Measurement Technology of Time of Flight Based on Gated Microchannel Plates[J]. Acta Optica Sinica, 2018, 38(2): 0204002
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