A time of flight (TOF) measurement system based on the gated microchannel plate (MCP) technology is reported. The electrons and the strobe pulse can simultaneously arrive at the MCP under a suitable MCP strobe pulse delay, and so that dynamic images can be produced. The TOF of electrons at the drift space of 50 cm is measured by using a high speed oscilloscope. When the cathode voltage of -3.5 kV is applied, it takes electrons about 15 ns to travel from cathode to MCP. The relationship between the TOF and electron energy is obtained via tuning the cathode voltage. The results show that the TOF decreases with the increase of electron energy, and the temporal resolution of the TOF measurement system is 88 ps.