Researching | Transient characteristics of electron beam induced current in dielectric and semiconductor sample

Journals >Acta Physica Sinica >Volume 69 >Issue 6 >Page 060201-1 > Article

Acta Physica Sinica
Vol. 69, Issue 6, 060201-1 (2020)

Transient characteristics of electron beam induced current in dielectric and semiconductor sample

Wei-Qin Li^1、2、*, Zhi-Sheng Huo¹, and Hong-Bin Pu¹

Author Affiliations

¹School of Automation & Information Engineering, Xi’an University of Technology, Xi’an 710048, China

²Department of Electronic Science and Technology, Xi’an Jiaotong University, Xi’an 710049, China

show less

DOI: 10.7498/aps.69.20191543 Cite this Article

Wei-Qin Li, Zhi-Sheng Huo, Hong-Bin Pu. Transient characteristics of electron beam induced current in dielectric and semiconductor sample[J]. Acta Physica Sinica, 2020, 69(6): 060201-1 Copy Citation Text

show less

References

[1] Zhang M, Wang X X, Cao W Q, Yuan J, Cao M S[J]. Adv. Opt. Mater., 7, 1900689(2019).

[2] Cao M S, Wang X X, Zhang M, Shu J C, Cao W Q, Yang H J, Fang X Y, Yuan J[J]. Adv. Funct. Mater., 29, 1807398(2019).

[3] Ben Ammar L, Fakhfakh S, Jbara O, Rondot S[J]. J. Microsc., 265, 322(2017).

[4] Cazaux J[J]. J. Electron. Spectrosc. Relat. Phenom., 176, 58(2010).

[5] Bai M, Pease F[J]. J. Vac. Sci. Technol. B, 22, 2907(2004).

[6] Ben Ammar L, Fakhfakh S, Jbara O, Rondot S, Hadjadj A[J]. Micron, 98, 39(2017).

[7] Wong W K, Rau E I, Thong J T L[J]. Ultramicroscopy, 101, 183(2004).

[8] Zhang H B, Li W Q, Wu D W[J]. J. Electron Microsc., 58, 15(2009).

[9] Hoskins B D, Adam G C, Strelcov E, Zhitenev N, Kolmakov A, Strukov D B, McClelland J J[J]. Nat. Commun., 8, 1972(2017).

[10] Fitting H J, Touzin M[J]. J. Appl. Phys., 110, 044111(2011).

[11] Sun X L, Gao S W, Mao X, Gong X X, Yu L J, Song X B, Chai Y Y, Shang F L, Xin S S, Tai Y J[J]. Infrared Technology, 41, 742(2019).

[12] Fakhfakh S, Jbara O, Rondot S, Hadjadj A, Fakhfakh Z[J]. J. Non-Cryst Solids, 358, 1157(2012).

[13] Feng G B, Cao M, Cui W Z, Li J, Liu C L, Wang F[J]. Acta Phys. Sin., 66, 067901(2017).

[14] Li W Q, Hao J, Zhang H B[J]. Acta Phys. Sin., 64, 086801(2015).

[15] Bai C J, Feng G B, Cui W Z, He Y N, Zhang W, Hu S G, Ye M, Hu T C, Huang G S, Wang Q[J]. Acta Phys. Sin., 67, 037902(2018).

[16] Cornet N, Goeuriot D, Guerret-Piécourt C, Juvé D, Tréheux D, Touzin M, Fitting H J[J]. J. Appl. Phys., 103, 064110(2008).

[17] Cazaux J[J]. J. Electron Microsc., 61, 261(2012).

[18] Li W Q, Mu K, Xia R H[J]. Micron, 42, 443(2011).

[19] Li W Q, Liu D, Zhang H B[J]. Acta Phys. Sin., 63, 227303(2014).

[20] Weng M, Hu T C, Cao M, Xu W J[J]. Acta Phys. Sin., 64, 157901(2015).

[21] Joy D C[J]. Monte Carlo Modeling for Electron Microscopy and Microanalysis, 27(1995).

[22] Touzin M, Goeuriot D, Guerret-Piécourt C, Juvé D, Tréheux D, Fitting H J[J]. J. Appl. Phys., 99, 114110(2006).

[23] Cao M S, Shu J C, Wang X X, Wang X, Zhang M, Yang H J, Fang X, Yuan J[J]. Ann. Phys., 531, 1800390(2019).

[24] Buchanan D A, Fischetti M V, Dimaria D J[J]. Phys. Rev. B, 43, 1471(1991).

[25] Gushterov A, Simeonov S[J]. Vacuum, 76, 315(2004).

[26] Rau E I[J]. Appl. Surf. Sci., 254, 2110(2008).

Get PDF(in Chinese)

Figures&Tables (14)

References (26)

Copy Citation Text

Wei-Qin Li, Zhi-Sheng Huo, Hong-Bin Pu. Transient characteristics of electron beam induced current in dielectric and semiconductor sample[J]. Acta Physica Sinica, 2020, 69(6): 060201-1

Download Citation

Save the article for my favorites

Paper Information

Recommended Topics

Nuclear physics

Particles and fields

Particle and nuclear astrophysics and cosmology

Set citation alerts for the article

Please enter your email address