• Laser & Optoelectronics Progress
  • Vol. 55, Issue 4, 043002 (2018)
Linxiao Cong1、2, Min Huang1、*, and Qisheng Cai1
Author Affiliations
  • 1 Key Laboratory of Computation Optical Imaging Technology, Academy of Opto-Electronics, Chinese Academy of Sciences, Beijing 100094, China
  • 2 College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/LOP55.043002 Cite this Article Set citation alerts
    Linxiao Cong, Min Huang, Qisheng Cai. Spectral Resolution Enhancement Based on Two-Dimensional Shear Interference[J]. Laser & Optoelectronics Progress, 2018, 55(4): 043002 Copy Citation Text show less
    (a) Spectrometer based on 2D shear interference; (b) rotational FPA; (c) conventional FPA
    Fig. 1. (a) Spectrometer based on 2D shear interference; (b) rotational FPA; (c) conventional FPA
    Relative OPD distribution on the detector
    Fig. 2. Relative OPD distribution on the detector
    Laser lines recovery using interferograms of different pixels. (a) θ=3.31°, 320 pixel; (b) θ=5°, 320 pixel; (c) θ=10°, 765 pixel
    Fig. 3. Laser lines recovery using interferograms of different pixels. (a) θ=3.31°, 320 pixel; (b) θ=5°, 320 pixel; (c) θ=10°, 765 pixel
    Irradiance distribution of a single line
    Fig. 4. Irradiance distribution of a single line
    Irradiance distribution of oblique stitching
    Fig. 5. Irradiance distribution of oblique stitching
    Interferogram of 320 pixel and 768 pixel after apodization
    Fig. 6. Interferogram of 320 pixel and 768 pixel after apodization
    Absorption spectra of carnauba wax recovered with different sampling points and reference input specrum
    Fig. 7. Absorption spectra of carnauba wax recovered with different sampling points and reference input specrum
    Interferogram detected by CCD after rotating 18.435°
    Fig. 8. Interferogram detected by CCD after rotating 18.435°
    Interferogram and spectrum detecting inclined to the detecting direction. (a) Simulation result; (b) stitching sampling model
    Fig. 9. Interferogram and spectrum detecting inclined to the detecting direction. (a) Simulation result; (b) stitching sampling model
    Linxiao Cong, Min Huang, Qisheng Cai. Spectral Resolution Enhancement Based on Two-Dimensional Shear Interference[J]. Laser & Optoelectronics Progress, 2018, 55(4): 043002
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