• Acta Optica Sinica
  • Vol. 40, Issue 4, 0412001 (2020)
Xingxing Zhu1, Dingrong Yi1、*, Yiqing Ye1, Linhua Kong2, and Zhiqun Liu1
Author Affiliations
  • 1College of Mechanical Engineering and Automation, Huaqiao University, Xiamen, Fujian 361021, China
  • 2School of Mechanical & Automotive Engineering, Fujian University of Technology, Fuzhou, Fujian 350118, China;
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    DOI: 10.3788/AOS202040.0412001 Cite this Article Set citation alerts
    Xingxing Zhu, Dingrong Yi, Yiqing Ye, Linhua Kong, Zhiqun Liu. High-Precision Three-Dimensional Shape Measurement Based on Anti-Interference Parallel Object-Side Differential Axial[J]. Acta Optica Sinica, 2020, 40(4): 0412001 Copy Citation Text show less
    Principle illustration of parallel object-side differential axial measurement method
    Fig. 1. Principle illustration of parallel object-side differential axial measurement method
    Experimental setup of the parallel object-side differential axial measurement method
    Fig. 2. Experimental setup of the parallel object-side differential axial measurement method
    Calibration curve of axial measurement
    Fig. 3. Calibration curve of axial measurement
    Coin surface morphology is affected by disturbance error. (a) Uneven illumination; (b) effect of coin surface reduction by uneven illumination
    Fig. 4. Coin surface morphology is affected by disturbance error. (a) Uneven illumination; (b) effect of coin surface reduction by uneven illumination
    Logarithmic differential confocal microscopy calibration curve of axial measurement
    Fig. 5. Logarithmic differential confocal microscopy calibration curve of axial measurement
    Experimental sample STEP-Si-5-1 and measurement position
    Fig. 6. Experimental sample STEP-Si-5-1 and measurement position
    Photo of a dime as the second experimental sample
    Fig. 7. Photo of a dime as the second experimental sample
    Measurement images of coin surface morphology by the proposed method. (a) MF; (b) MA; (c) MS; (d) MX; (e) MJF; (f) MJA
    Fig. 8. Measurement images of coin surface morphology by the proposed method. (a) MF; (b) MA; (c) MS; (d) MX; (e) MJF; (f) MJA
    Reduction result of coin surface morphology after error compensation
    Fig. 9. Reduction result of coin surface morphology after error compensation
    Reduction of coin surface morphology. (a) Before error compensation; (b) after error compensation
    Fig. 10. Reduction of coin surface morphology. (a) Before error compensation; (b) after error compensation
    Height measurement curve of optical surface profilometer. (a) Two-dimensional section view of sample height; (b) top view of three-dimensional height profile of the sample
    Fig. 11. Height measurement curve of optical surface profilometer. (a) Two-dimensional section view of sample height; (b) top view of three-dimensional height profile of the sample
    Step numberPre-corrected measurement /μmCorrected measurement /μmStep numberPre-corrected measurement /μmCorrected measurement /μm
    15.5524.82584.8244.694
    25.5084.68694.5524.683
    35.4254.853104.4264.693
    45.3134.684114.1154.947
    55.4044.852124.1674.742
    64.9834.872134.2254.904
    74.9044.653
    Table 1. Measurement results of step sample in STEP-Si-5-1
    Xingxing Zhu, Dingrong Yi, Yiqing Ye, Linhua Kong, Zhiqun Liu. High-Precision Three-Dimensional Shape Measurement Based on Anti-Interference Parallel Object-Side Differential Axial[J]. Acta Optica Sinica, 2020, 40(4): 0412001
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