• Chinese Journal of Quantum Electronics
  • Vol. 21, Issue 4, 542 (2004)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Tests and analyses of multilayer structure HB-LED epitaxial slice by electrochemical C-V measurement[J]. Chinese Journal of Quantum Electronics, 2004, 21(4): 542 Copy Citation Text show less
    References

    [1] Kinder R. Carrier profiling of a heterojunction bipolar transistor and p-i-n photodiodestructures by electrochemical C-V technique [J]. Physica Status Solidi A, 1999, 175: 631-636.

    [5] Huang K H, et al. Towfold efficiency improvement in high performance AlGaInP LEDs in the 555~620 nm spectral region using a thick GaP window layer [J]. Appl. Phys. Lett., 1992, 61(9): 1045.

    [in Chinese], [in Chinese], [in Chinese]. Tests and analyses of multilayer structure HB-LED epitaxial slice by electrochemical C-V measurement[J]. Chinese Journal of Quantum Electronics, 2004, 21(4): 542
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