• Laser & Optoelectronics Progress
  • Vol. 56, Issue 15, 151201 (2019)
Meng Jia, Changxi Xue*, Chuang Li, Xirui Lan, Lei Wang, Lun Wang, and Bairong Wu
Author Affiliations
  • School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    DOI: 10.3788/LOP56.151201 Cite this Article Set citation alerts
    Meng Jia, Changxi Xue, Chuang Li, Xirui Lan, Lei Wang, Lun Wang, Bairong Wu. Q-Type Asphere Testing Technology Based on MATLAB and Aspheric Profilometer[J]. Laser & Optoelectronics Progress, 2019, 56(15): 151201 Copy Citation Text show less
    Theoretical aspherical surface. (a) Q-type asphere; (b) fitting standard even asphere
    Fig. 1. Theoretical aspherical surface. (a) Q-type asphere; (b) fitting standard even asphere
    Fitting error curve
    Fig. 2. Fitting error curve
    Surface departure curves. (a) Q-type asphere; (b) fitting standard even asphere; (c) difference of deviation between two aspheric surfaces
    Fig. 3. Surface departure curves. (a) Q-type asphere; (b) fitting standard even asphere; (c) difference of deviation between two aspheric surfaces
    Actual processing aspherical work piece
    Fig. 4. Actual processing aspherical work piece
    Detection result of fitting standard even asphere
    Fig. 5. Detection result of fitting standard even asphere
    Detection results of Q-type asphere. (a) Before data processing; (b) after data processing
    Fig. 6. Detection results of Q-type asphere. (a) Before data processing; (b) after data processing
    ParameterSpindle speed /(r·min-1)Feed rate /(mm·min-1)Cutting depthd /μm-1
    Roughturning200063
    Halffinishedturning200041
    Finishingturning200020.5
    Table 1. Main processing parameters
    Meng Jia, Changxi Xue, Chuang Li, Xirui Lan, Lei Wang, Lun Wang, Bairong Wu. Q-Type Asphere Testing Technology Based on MATLAB and Aspheric Profilometer[J]. Laser & Optoelectronics Progress, 2019, 56(15): 151201
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