• Acta Optica Sinica
  • Vol. 42, Issue 2, 0212001 (2022)
Haiyang Li1, Binliang Zhi1, Qianghua Pan2, Zhiwu An3, and Ruien Yu1、*
Author Affiliations
  • 1Shanxi Provincial Key Laboratory of Advanced Manufacturing Technology, North University of China, Taiyuan, Shanxi 0 30051, China
  • 2China Special Equipment Inspection & Research Institute, Beijing 100029, China;
  • 3Institute of Acoustics, Chinese Academy of Sciences, Beijing 100190, China
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    DOI: 10.3788/AOS202242.0212001 Cite this Article Set citation alerts
    Haiyang Li, Binliang Zhi, Qianghua Pan, Zhiwu An, Ruien Yu. Photoacoustic Detection Method for Depth of Surface Narrow Defects[J]. Acta Optica Sinica, 2022, 42(2): 0212001 Copy Citation Text show less
    Waveform conversion phenomenon at tip of surface defect
    Fig. 1. Waveform conversion phenomenon at tip of surface defect
    Ultrasonic field of surface defect at different moments. (a) 3.77 μs; (b) 3.95 μs; (c) 4.26 μs; (d) 4.51 μs
    Fig. 2. Ultrasonic field of surface defect at different moments. (a) 3.77 μs; (b) 3.95 μs; (c) 4.26 μs; (d) 4.51 μs
    Simulation waveforms of narrow defect
    Fig. 3. Simulation waveforms of narrow defect
    Simulation waveforms of extremely narrow defects
    Fig. 4. Simulation waveforms of extremely narrow defects
    Simulation waveforms of wide defects
    Fig. 5. Simulation waveforms of wide defects
    Experimental platform of laser ultrasound and sample
    Fig. 6. Experimental platform of laser ultrasound and sample
    Experimental detection waveforms
    Fig. 7. Experimental detection waveforms
    Depth measurement results of narrow defects
    Fig. 8. Depth measurement results of narrow defects
    Depth measurement results of narrow defect and extremely narrow defect
    Fig. 9. Depth measurement results of narrow defect and extremely narrow defect
    Defect size /(mm×mm)0.2×0.10.2×0.20.3×0.20.4×0.20.5×0.2
    tRR /μs4.714.714.714.714.71
    tRS /μs4.915.015.085.125.18
    Δt /μs0.200.300.370.410.47
    Measuring depth /mm0.18650.17980.31500.39240.5083
    Error /mm-0.0135-0.02020.0150-0.00760.0083
    Error rate /%6.7410.125.021.911.66
    Table 1. Simulation data of narrow defects
    Defect size /(mm×mm)1×0.052×0.13×0.14×0.15×0.1
    tRR /μs4.714.714.714.714.71
    tRS /μs5.275.746.286.867.45
    Δt /μs0.561.031.572.152.74
    Measuring depth 1 /mm1.08221.99053.03414.15505.2952
    Error 1 /mm0.0822-0.00950.03410.15500.2952
    Error rate 1 /%8.220.471.143.885.90
    Measuring depth 2 /mm0.98221.79052.83413.95505.0952
    Error 2 /mm-0.0178-0.2095-0.1659-0.04500.0952
    Error rate 2 /%1.7810.475.531.121.90
    Table 2. Simulation data of extremely narrow defects
    Defect size /(mm×mm)0.1×0.20.1×0.250.2×0.250.2×0.30.2×0.5
    tRR /μs4.714.714.714.714.71
    tRS /μs4.924.955.015.065.19
    Δt /μs0.210.240.300.350.48
    Measuring depth /mm0.0058-0.03620.07980.0764-0.0724
    Error δ /mm-0.0942-0.1362-0.1202-0.1236-0.2724
    Error rate /%94.16136.1960.1261.80136.19
    Table 3. Simulation data of wide defects
    d /mm0.10.20.30.40.5
    tRR /μs20.5220.5220.5220.5220.52
    tRS /μs20.7320.8220.8820.9421
    Δt /μs0.210.30.360.420.48
    Measuring depth /mm0.00580.17980.29570.41170.5276
    Error δ /mm-0.0942-0.0202-0.00430.01170.0276
    Error rate /%94.1610.121.432.925.53
    Table 4. Experimental data of surface defects
    d /mm0.10.150.20.250.50.751
    tRR /μs4.714.714.714.714.714.714.71
    tRS /μs4.864.884.94.935.085.235.32
    Δt /μs0.150.170.190.220.370.520.61
    Measuring depth 1 /mm0.28990.32850.36720.42520.71501.00491.1789
    Error 1 /mm0.18990.17850.16720.17520.21500.25490.1789
    Error rate 1 /%189.88119.0283.5970.0743.0133.9917.89
    Measuring depth 2 /mm0.08990.12850.16720.22520.51500.80490.9789
    Error 2 /mm-0.0101-0.0215-0.0328-0.02480.01500.0549-0.0211
    Error rate 2 /%10.1214.3116.419.933.017.322.11
    Table 5. Cooper’s experimental data analysis
    d /mm0.312345
    tRR /μs4.714.714.714.714.714.71
    tRS /μs4.965.325.846.326.877.45
    Δt /μs0.250.611.131.612.162.74
    Measuring depth 1 /mm0.48311.17892.18383.11144.17435.2952
    Error 1 /mm0.18310.17890.18380.11140.17430.2952
    Error rate 1 /%61.0517.899.193.714.365.90
    Measuring depth 2 /mm0.28310.97891.98382.91143.97435.0952
    Error 2 /mm-0.0169-0.0211-0.0162-0.0886-0.02570.0952
    Error rate 2 /%5.622.110.812.950.641.90
    Table 6. Data analysis for Jeong’s experiment
    Haiyang Li, Binliang Zhi, Qianghua Pan, Zhiwu An, Ruien Yu. Photoacoustic Detection Method for Depth of Surface Narrow Defects[J]. Acta Optica Sinica, 2022, 42(2): 0212001
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