Photoacoustic Detection Method for Depth of Surface Narrow Defects

Haiyang Li; Binliang Zhi; Qianghua Pan; Zhiwu An; Ruien Yu

doi:10.3788/AOS202242.0212001

Journals >Acta Optica Sinica >Volume 42 >Issue 2 >Page 0212001 > Article

Acta Optica Sinica
Vol. 42, Issue 2, 0212001 (2022)

Photoacoustic Detection Method for Depth of Surface Narrow Defects

Haiyang Li¹, Binliang Zhi¹, Qianghua Pan², Zhiwu An³, and Ruien Yu^1、*

Author Affiliations

¹Shanxi Provincial Key Laboratory of Advanced Manufacturing Technology, North University of China, Taiyuan, Shanxi 0 30051, China

²China Special Equipment Inspection & Research Institute, Beijing 100029, China;

³Institute of Acoustics, Chinese Academy of Sciences, Beijing 100190, China

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DOI: 10.3788/AOS202242.0212001 Cite this Article Set citation alerts

Haiyang Li, Binliang Zhi, Qianghua Pan, Zhiwu An, Ruien Yu. Photoacoustic Detection Method for Depth of Surface Narrow Defects[J]. Acta Optica Sinica, 2022, 42(2): 0212001 Copy Citation Text

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Haiyang Li, Binliang Zhi, Qianghua Pan, Zhiwu An, Ruien Yu. Photoacoustic Detection Method for Depth of Surface Narrow Defects[J]. Acta Optica Sinica, 2022, 42(2): 0212001

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