Near Infrared Spectroscopy Process Pattern Fault Detection Based on Mutual Information Entropy

[1] Minh V T, Afzulpurkar N, Muhamad W M W. Mathematical Problems in Engineering, 2015, 2007(1): 32.

[2] Yu J. Engineering Applications of Artificial Intelligence, 2013, 26(1): 456.

[3] Haghani A, Jeinsch T, Ding S X. IEEE Transactions on Industrial Electronics, 2014, 61(11): 6446.

[4] Chen Z, Zhang K, Ding S X, et al. Journal of Process Control, 2016, 41: 26.

[5] Chen Z, Fang H, Chang Y. IEEE Transactions on Industrial Electronics, 2016, 63(5): 3290.

[7] Paninski L. Neural Computation, 2014, 15(6): 1191.

[8] Lee K, Lee B W, Choi D H, et al. Journal of the Electrochemical Society, 2014, 18(3): 53.

[9] Zhao Q H, Chen M. Analytical Letters, 2015, 48(2): 301.

[10] Zeng X, Wu J, Wang D, et al. Journal of Hydrology, 2016, 538: 689.

[11] Peng H, Long F, Ding C. IEEE Trans Pattern Anal. Mach. Intell., 2005, 27(8): 1226.

[12] Cheng J, Greiner R. IEEE Transactions on Vehicular Technology, 2013, 63(5): 2002.

[13] Liu Z J, Guo S L, Tian-Yuan L I, et al. Journal of Hydraulic Engineering, 2014, 45(9): 1019.