[2] H H Radamson, E Simeon. CMOS past, present and future. Amsterdam: Elsevier, 105(2018).
[5] H H Radamson, X B He, Q Z Zhang et al. Miniaturization of cmos. Micromachines, 10, 293(2019).
[19] Y C Liu, C T Tu, C E Tsai et al. First highly stacked Ge0.95Si0.05 nGAAFETs with record ION = 110 μA (4100 μA/μm) at VOV=VDS=0.5V and high Gm, max = 340 μS (13000 μS/μm) at VDS=0.5V by wet etching, 1(2021).