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    Journals >Electro-Optic Technology Application >Volume 29 >Issue 2 >Page 95 > Article
    • Electro-Optic Technology Application
    • Vol. 29, Issue 2, 95 (2014)
    Test Analysis of Rise Time of Semiconductor Laser Based on Thermocouple Dynamic Calibration System
    YANG Yu1,2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    YANG Yu. Test Analysis of Rise Time of Semiconductor Laser Based on Thermocouple Dynamic Calibration System[J]. Electro-Optic Technology Application, 2014, 29(2): 95 Copy Citation Text show less
    References

    [3] Michalski L, Eckersdorf K, Kucharski J, et al. Temperatures measurement[M].Chichester: John Wiley, Sons. 2001: 279-332.

    CLP Journals

    [1] Hao Xiaojian, Zhang Genfu, Zan Qingbo. Thermocouple Time Constant Test System and Uncertainty Analysis Based on Semiconductor Lasers[J]. Laser & Optoelectronics Progress, 2016, 53(8): 81408

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    YANG Yu. Test Analysis of Rise Time of Semiconductor Laser Based on Thermocouple Dynamic Calibration System[J]. Electro-Optic Technology Application, 2014, 29(2): 95
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