Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials

Zhiya Dang; Yuqing Luo; Xue-Sen Wang; Muhammad Imran; Pingqi Gao

doi:10.3788/COL202119.030002

Journals >Chinese Optics Letters >Volume 19 >Issue 3 >Page 030002 > Article

Chinese Optics Letters
Vol. 19, Issue 3, 030002 (2021)

Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials

Zhiya Dang^1、*, Yuqing Luo¹, Xue-Sen Wang², Muhammad Imran³, and Pingqi Gao^1、**

Author Affiliations

¹School of Materials, Sun Yat-sen University, Guangzhou 510006, China

²Department of Physics, National University of Singapore, Singapore 117551, Singapore

³Department of Nanochemistry, Istituto Italiano di Tecnologia, Via Morego 30, Genova 16163, Italy

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DOI: 10.3788/COL202119.030002 Cite this Article Set citation alerts

Zhiya Dang, Yuqing Luo, Xue-Sen Wang, Muhammad Imran, Pingqi Gao. Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials[J]. Chinese Optics Letters, 2021, 19(3): 030002 Copy Citation Text

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