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    Journals >Laser & Optoelectronics Progress >Volume 51 >Issue 11 >Page 111202 > Article
    • Laser & Optoelectronics Progress
    • Vol. 51, Issue 11, 111202 (2014)
    Spectral Response Testing and Uncertainty Evaluation of Plane Array CCD
    Li Xiaojie1、2、*, Ren Jianwei1, Liu Hongxing1, and Wan Zhi1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop51.111202 Cite this Article Set citation alerts
    Li Xiaojie, Ren Jianwei, Liu Hongxing, Wan Zhi. Spectral Response Testing and Uncertainty Evaluation of Plane Array CCD[J]. Laser & Optoelectronics Progress, 2014, 51(11): 111202 Copy Citation Text show less
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    Li Xiaojie, Ren Jianwei, Liu Hongxing, Wan Zhi. Spectral Response Testing and Uncertainty Evaluation of Plane Array CCD[J]. Laser & Optoelectronics Progress, 2014, 51(11): 111202
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