Temperature Inversion Algorithm for Multi-Spectral Measurement of Material Shock Radiation Characteristics

Ningchao Zhang; Fan Yang; Juan Ren; Yuetao Du; Peng Wang; Fusheng Liu

doi:10.3788/AOS202242.0912003

Journals >Acta Optica Sinica >Volume 42 >Issue 9 >Page 0912003 > Article

Acta Optica Sinica
Vol. 42, Issue 9, 0912003 (2022)

Temperature Inversion Algorithm for Multi-Spectral Measurement of Material Shock Radiation Characteristics

Ningchao Zhang^1、*, Fan Yang¹, Juan Ren², Yuetao Du¹, Peng Wang^1、**, and Fusheng Liu³

Author Affiliations

¹College of Electronics and Information Engineering, Xi′an Technological University, Xi′an 710021, Shaanxi, China

²School of Science, Xi′an Technological University, Xi′an 710021, Shaanxi, China

³Key Laboratory of Advanced Technologies of Materials, Ministry of Education, Southwest Jiaotong University, Chengdu 610031, Sichuan, China

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DOI: 10.3788/AOS202242.0912003 Cite this Article Set citation alerts

Ningchao Zhang, Fan Yang, Juan Ren, Yuetao Du, Peng Wang, Fusheng Liu. Temperature Inversion Algorithm for Multi-Spectral Measurement of Material Shock Radiation Characteristics[J]. Acta Optica Sinica, 2022, 42(9): 0912003 Copy Citation Text

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Fig. 1. Emissivity of three models with different values of M. (a) Model A; (b) model B; (c) model C

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Fig. 2. Emissivity of three models with different values of α. (a) Model A; (b) model B; (c) model C

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Fig. 3. Emissivity of three models with different values of w. (a) Model A; (b) model B; (c) model C

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Fig. 4. Emissivity of three models with different values of c₁ and c₂. (a) Model A; (b) model B; (c) model C

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Fig. 5. Combined algorithm flow diagram

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Fig. 6. Emissivity of model A obtained by different algorithms. (a) Sample temperature is 2000 K; (b) sample temperature is 2030 K; (c) sample temperature is 2060 K

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Fig. 7. Emissivity of model B obtained by different algorithms. (a) Sample temperature is 2000 K; (b) sample temperature is 2030 K; (c) sample temperature is 2060 K

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Fig. 8. Emissivity of model C obtained by different algorithms. (a) Sample temperature is 2000 K; (b) sample temperature is 2030 K; (c) sample temperature is 2060 K

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Fig. 9. Schematic diagram of shock radiation temperature measurement experiment system

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Fig. 10. Radiation intensity of sapphire under shock

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Fig. 11. Relationship between radiation temperature and pressure of sapphire

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Time	t₁	t₂	t₃	t₄	t₅	t₆
Temperature /K	3255.4	3415.4	3532.0	3656.3	3649.8	3624.0

Table 1. 0 Temperature inversion results at different time

Sample	0.4 nm	0.5 nm	0.6 nm	0.7 nm	0.8 nm	0.9 nm	1 nm	1.1 nm
A	0.85	0.80	0.75	0.70	0.65	0.60	0.55	0.50
B	0.50	0.55	0.60	0.65	0.70	0.75	0.80	0.85
C	0.85	0.80	0.75	0.70	0.70	0.75	0.80	0.85

Table 1. Emissivity model of matter

Sample	M=0.1	M=0.2	M=0.3	M=0.4	M=0.5	M=0.6	M=0.7	M=0.8	M=0.9
A	2016.31	2017.42	1982.83	1983.56	2016.71	2016.37	1982.74	2016.91	1983.57
B	1972.83	2026.23	2026.87	2026.13	1972.03	2026.62	2026.92	1973.60	2027.52
C	2009.04	2008.54	2009.20	2008.15	1991.54	1991.54	1991.54	2008.95	2009.65

Table 2. Temperature inversion results of three models with different values of MK

Sample	2	2.5	3	3.5	4	4.5
A	2015.15	1984.11	2014.61	1985.88	1984.77	2015.18
B	1967.40	2033.94	1966.74	1967.68	2032.56	2033.46
C	2006.01	2007.79	2006.77	2007.44	1992.73	2006.85

Table 3. Temperature inversion results of three models with different values of αK

Sample	Fixed value w	Linear iteration value w	Improved iterative value w
A	2037.1	2027.6	2016.6
B	2043.6	1951.2	1961.3
C	2020.1	2003.6	2003.1

Table 4. Inversion temperature results of three models with different values of wK

Sample	Fixed values c₁ and c₂	Improved iterative values c₁ and c₂
A	2034.1	2026.7
B	1950.4	1970.1
C	2043.8	2035.2

Table 5. Temperature inversion results of three models with different values of c₁ and c₂K

Channel No.	1	2	3	4	5	6	7	8
Wavelength /μm	0.4	0.5	0.6	0.7	0.8	0.9	1.0	1.1

Table 6. Effective wavelengths of 8 channels

Sample	1	2	3	4	5	6	7	8
A1	0.85	0.80	0.75	0.70	0.65	0.60	0.55	0.50
A2	0.85	0.83	0.81	0.79	0.77	0.75	0.73	0.71
A3	0.80	0.75	0.70	0.65	0.60	0.55	0.50	0.45
A4	0.80	0.78	0.76	0.74	0.72	0.70	0.68	0.66
A5	0.75	0.70	0.65	0.60	0.55	0.50	0.45	0.40
A6	0.75	0.73	0.71	0.69	0.67	0.65	0.63	0.61
A7	0.70	0.65	0.60	0.55	0.50	0.45	0.40	0.35
A8	0.70	0.68	0.66	0.64	0.62	0.60	0.58	0.56
A9	0.65	0.60	0.55	0.50	0.45	0.40	0.35	0.30
B1	0.50	0.55	0.60	0.65	0.70	0.75	0.80	0.85
B2	0.71	0.73	0.75	0.77	0.79	0.81	0.83	0.85
B3	0.45	0.50	0.55	0.60	0.65	0.70	0.75	0.80
B4	0.66	0.68	0.70	0.72	0.74	0.76	0.78	0.80
B5	0.40	0.45	0.50	0.55	0.60	0.65	0.70	0.75
B6	0.61	0.63	0.65	0.67	0.69	0.71	0.73	0.75
B7	0.35	0.40	0.45	0.50	0.55	0.60	0.65	0.70
B8	0.56	0.58	0.60	0.62	0.64	0.66	0.68	0.70
B9	0.30	0.35	0.40	0.45	0.50	0.55	0.60	0.65
C1	0.85	0.80	0.75	0.70	0.70	0.75	0.80	0.85
C2	0.80	0.78	0.76	0.74	0.76	0.78	0.80	0.82
C3	0.78	0.76	0.74	0.72	0.70	0.72	0.74	0.76
C4	0.76	0.74	0.72	0.70	0.68	0.70	0.72	0.74
C5	0.75	0.70	0.65	0.60	0.65	0.70	0.75	0.80
C6	0.74	0.72	0.70	0.68	0.66	0.68	0.70	0.72
C7	0.72	0.70	0.68	0.66	0.68	0.70	0.72	0.74
C8	0.70	0.68	0.66	0.64	0.62	0.64	0.66	0.68
C9	0.68	0.66	0.64	0.62	0.60	0.62	0.64	0.66

Table 7. Emissivity samples of 8 channels

Emissivity model	Reference temperature /K	Least squares method		BP neural network			IPSO-multiplier penalty function
Emissivity model	Reference temperature /K	Temperature /K	Relative error /%	Temperature /K	Relative error /%		Temperature /K	Relative error /%
A1		1943.75				-2.8125			2032.31	1.61550	2022.21	1.1105000
B1	2000	1961.49				-1.9255			2020.43	1.02150	2007.43	0.3715000
C1		1979.20				-1.0400			2042.25	2.11250	2041.34	2.0670000
A1		1926.64				-5.0916			2052.07	1.08719	2053.04	1.1349754
B1	2030	1954.46				-3.7212			2036.25	0.30788	2037.62	0.3753695
C1		1982.25				-2.3522			2062.71	1.61133	2047.73	0.8733990
A1		1951.92				-5.2466			2074.75	0.71602	2073.72	0.6660194
B1	2060	1980.49				-3.8597			2054.28	-0.27770	2067.18	0.3485437
C1		2009.03				-2.4743			2086.01	1.26262	2048.05	-1.0655340

Table 8. Temperature inversion results of three models obtained by three methods

Time	Radiation intensity of different wavelength
Time	0.488 μm	0.509 μm	0.533 μm	0.589 μm	0.650 μm	0.702 μm	0.779 μm	0.809 μm
t₁	0.516	0.554	0.664	0.688	0.764	0.695	0.715	0.650
t₂	0.801	0.923	0.109	0.115	0.125	1.140	1.180	1.090
t₃	1.160	1.250	1.420	1.650	1.710	1.660	1.630	1.480
t₄	1.510	1.700	2.020	2.220	2.370	2.300	2.260	2.110
t₅	1.770	2.130	2.480	2.800	3.000	2.840	2.970	2.672
t₆	2.040	2.390	2.820	3.250	3.580	3.500	3.560	3.320

Table 9. Radiation intensity of 8 channels at different time10¹¹ W·m^-3·Sr^-1

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