[1] Xu X F, Cao Y P, Peng K et al. On-line three-dimensional measurement based on phase prediction[J]. Acta Optica Sinica, 36, 0612005(2016).
[2] Zhang E, Laufer J, Beard P. Backward-mode multiwavelength photoacoustic scanner using a planar Fabry-Perot polymer film ultrasound sensor for high-resolution three-dimensional imaging of biological tissues[J]. Applied Optics, 47, 561-577(2008).
[3] Chen L C[J]. Chang Y W. High accuracy confocal full-field 3-D surface profilometry for micro lenses using a digital fringe projection strategy. Key Engineering Materials, 364/365/366, 113-116(2008).
[6] Peng K, Cao Y P, Wu Y C et al. On-line three-dimensional measurement method based on low modulation feature[J]. Chinese Journal of Lasers, 40, 0708006(2013).
[7] Saxena M, Eluru G, Gorthi S S. Structured illumination microscopy[J]. Advances in Optics and Photonics, 7, 241-275(2015).
[9] Su X Y, Zhou W S. Phase-measuring profilometry using defocused projection of the Ronchi grating[J]. Opto-Electronic Engineering, 20, 8-16(1993).
[10] Tian Z X, Chen W J, Su X Y. Method for improving accuracy and measurement speed of PMP using error diffusion binary encoded sinusoidal grating[J]. Laser & Optoelectronics Progress, 51, 121201(2014).
[12] Sun S J, Zhai A P, Cao Y P. A fast algorithm for obtaining 3D shape and texture information of objects[J]. Acta Optica Sinica, 36, 0312001(2016).
[14] Judge T R. Bryanston-Cross P J. A review of phase unwrapping techniques in fringe analysis[J]. Optics and Lasers in Engineering, 21, 199-239(1994).
[16] Zhang H Q, Guo R H, Jiang C et al. Improved path-independent phase unwrapping algorithm based on total-variation minimum denoising[J]. Laser & Optoelectronics Progress, 53, 121202(2016).
[17] Zhao W C, Lu Y G, Zhang T. Phase gradient correlation based quality map for two dimensional phase unwrapping[J]. Acta Optica Sinica, 29, 149-154(2009).
[18] Li W S, Su L K, Su X Y. Phase-measuring profilometry in big scale measurement[J]. Acta Optica Sinica, 20, 792-796(2000).
[22] Zhao L W, Da F P, Zheng D L. Method for binary grating generation using defocused projection for three-dimensional measurement[J]. Acta Optica Sinica, 36, 0812005(2016).