Phase Measurement Profilometry Based on Binary Gratings with Unequal Duty Cycle

Yuting Chen; Yiping Cao; Cheng Chen; Yingying Wan; Guangkai Fu; Yapin Wang; Lu Wang

doi:10.3788/AOS201838.0815021

Journals >Acta Optica Sinica >Volume 38 >Issue 8 >Page 0815021 > Article

Acta Optica Sinica
Vol. 38, Issue 8, 0815021 (2018)

Phase Measurement Profilometry Based on Binary Gratings with Unequal Duty Cycle

Yuting Chen^*, Yiping Cao^*, Cheng Chen, Yingying Wan, Guangkai Fu, Yapin Wang, and Lu Wang

Author Affiliations

College of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610065, China

show less

DOI: 10.3788/AOS201838.0815021 Cite this Article Set citation alerts

Yuting Chen, Yiping Cao, Cheng Chen, Yingying Wan, Guangkai Fu, Yapin Wang, Lu Wang. Phase Measurement Profilometry Based on Binary Gratings with Unequal Duty Cycle[J]. Acta Optica Sinica, 2018, 38(8): 0815021 Copy Citation Text

show less

Cited By

Article index updated: May. 21, 2024

Citation counts are provided from Researching.

The article is cited by 6 article(s) from Researching.

Download Citation

Set citation alerts for the article

Tools

Set citation alerts for the article

Save the article for my favorites

Paper Information