Robust hybrid laser linewidth reduction using Si3N4-based subwavelength hole defect assisted microring reflector

Jiachen Li; Baoyu Zhang; Sigang Yang; Hongwei Chen; Minghua Chen

doi:10.1364/PRJ.412284

Journals >Photonics Research >Volume 9 >Issue 4 >Page 558 > Article

Photonics Research
Vol. 9, Issue 4, 558 (2021)

Robust hybrid laser linewidth reduction using Si₃N₄-based subwavelength hole defect assisted microring reflector

Jiachen Li^1、2, Baoyu Zhang^1、2, Sigang Yang^1、2, Hongwei Chen^1、2, and Minghua Chen^1、2、*

Author Affiliations

¹Beijing National Research Center for Information Science and Technology (BNRist), Beijing 100084, China

²Department of Electronic Engineering, Tsinghua University, Beijing 100084, China

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DOI: 10.1364/PRJ.412284 Cite this Article Set citation alerts

Jiachen Li, Baoyu Zhang, Sigang Yang, Hongwei Chen, Minghua Chen. Robust hybrid laser linewidth reduction using Si₃N₄-based subwavelength hole defect assisted microring reflector[J]. Photonics Research, 2021, 9(4): 558 Copy Citation Text

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