Author Affiliations
1Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China2National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, Chinashow less
Fig. 1. Basic optical path of CMI algorithm, phase distribution of adopted binary random phase plate, and representative diffraction pattern. (a) Basic optical path of CMI algorithm; (b) phase distribution of adopted binary random phase plate; (c) representative diffraction pattern
Fig. 2. Relationship between B and φ(x) varying with increasing iterations
Fig. 3. Matrix representation of CMI pattern generation
Fig. 4. Scheme of convolution
Fig. 5. Basic optical path and simulation results. (a) Amplitude and phase of sample; (b) incident light of modulation plate; (c) spectrum and phase map of modulation plate; (d) pattern recorded by detector without modulation plate (image of sample); (e) diffraction pattern with modulation plate; (f) basic optical path
Fig. 6. Reconstructed results with different number of equations. (a) Complete diffraction pattern; (b)--(e) pattern random sampling when Nratio is 0.2, 1, 2, and 5, respectively; (f)--(j) reconstructed results corresponding to Figs. 6(a)--(e)
Fig. 7. Error curve and corresponding error gradient curve under different number of equations
Fig. 8. Reconstructed results under different spectral width of modulation plate. (a)--(e) Spectra of different modulators and corresponding phase maps; (f)--(j) diffraction patterns corresponding to Figs. 8(a)--(e); (k)--(o) reconstructed results corresponding to Figs. 8(a)--(e)
Fig. 9. Error curves and corresponding error gradient curves of reconstructed results with different spectral width of modulation plate
Fig. 10. Reconstruction results of light to be measured with different sparsity characteristics and same spectrum of modulation plate. (a)--(d) Diffraction patterns under different N″; (e)--(h) reconstructed results corresponding to Figs. 10(a)--(d)
Fig. 11. Reconstructed error under different spot width of light to be measured, without modulation plate. Green dashed line represents critical width