• Laser & Optoelectronics Progress
  • Vol. 57, Issue 22, 221101 (2020)
Peng Jiang1, Weixin Wang2, Ning Zhang2、*, Chengming Wang3, Wei Huang2, Gaojun Shi2, Xiaojing Xu2, and Shuhui Gao1、*
Author Affiliations
  • 1School of Forensic Science and investigation, People's Public Security University of China, Beijing 100038, China
  • 2National Engineering Laboratory for Forensic Science, Institute of Forensic Science, Ministry of Public Security, Beijing 100038, China
  • 3State Key Laboratory of Low-Dimensional Quantum Physics, Tsinghua University, Beijing 100084, China
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    DOI: 10.3788/LOP57.221101 Cite this Article Set citation alerts
    Peng Jiang, Weixin Wang, Ning Zhang, Chengming Wang, Wei Huang, Gaojun Shi, Xiaojing Xu, Shuhui Gao. Preliminary Study on Determining the Sequence of Intersecting Lines Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2020, 57(22): 221101 Copy Citation Text show less

    Abstract

    Determination of the sequence of intersecting lines has always been one of the difficult problems in the field of forensic science document inspection. Considering this, we first use a new technology for optical tomography, specifically optical coherence tomography (OCT), to study the sequence of intersecting lines. A frequency-domain OCT system with a center wavelength of 900nm is used to perform imaging and inspection on three different types of intersecting lines samples, to compare the feature differences of 2D tomographic OCT images of the intersecting lines of different types of samples and to analyze the feature differences. Preliminary experimental results show that OCT technology can provide an effective method for the judgment of the sequence of intersecting lines and can lay a foundation for supplementing and enriching the existing ecosystem of measurement techniques.
    Peng Jiang, Weixin Wang, Ning Zhang, Chengming Wang, Wei Huang, Gaojun Shi, Xiaojing Xu, Shuhui Gao. Preliminary Study on Determining the Sequence of Intersecting Lines Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2020, 57(22): 221101
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