Design of an automatic focusing system for 3-D topography measurement

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 3 >Page 56 > Article

Opto-Electronic Engineering
Vol. 31, Issue 3, 56 (2004)

Design of an automatic focusing system for 3-D topography measurement

[in Chinese]¹, [in Chinese]², and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Design of an automatic focusing system for 3-D topography measurement[J]. Opto-Electronic Engineering, 2004, 31(3): 56 Copy Citation Text

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References

[7] THOMAS TR.Rough surface[M].London:Imperial College Press,1999.

[8] NACER T,BONNET P.Selective Automatic Focusing For Microscope Images[A].Annual International Conference of the IEEE Engineering in Medicine and Biology Society[C].[s.l.]:[n.l.],1990.280-289.

[9] P LEE Yong-man,IKK Seong-jang,CHUNG Kee-wook.A fuzzy-control processor for automatic focusing[J].IEEE Trans-actions on Consumer Electronics,1994,40(2):412-420.

[10] T G LIU,H Y CAI,F L ZHANG ,et al.Photoelectric automatic focusing system based on interference[J].Optics and Lasers in Engineering,2001,36(4):345-353.

[in Chinese], [in Chinese], [in Chinese]. Design of an automatic focusing system for 3-D topography measurement[J]. Opto-Electronic Engineering, 2004, 31(3): 56

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