• Laser & Optoelectronics Progress
  • Vol. 58, Issue 14, 1412001 (2021)
Hui Jin1、3, Ming Zhang1、*, Guopeng Zhou2、3, Xiao Xiao2、3, and Yutao Zhu3
Author Affiliations
  • 1School of Electronic and Electrical Engineering, Wuhan Textile University, Wuhan, Hubei 430200, China
  • 2Institute of Engineering & Technology, Hubei University of Science and Technology, Xianning, Hubei 437100, China;
  • 3Hubei Xiangcheng Intelligent Electromechanical Industry Technology Research Institute Limited Company, Xianning, Hubei 437100, China
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    DOI: 10.3788/LOP202158.1412001 Cite this Article Set citation alerts
    Hui Jin, Ming Zhang, Guopeng Zhou, Xiao Xiao, Yutao Zhu. Phase Error Restraint Method for Fringe Projection Measurement System[J]. Laser & Optoelectronics Progress, 2021, 58(14): 1412001 Copy Citation Text show less
    Sketch maps of phase unwrapping. (a) Wrapped phases ϕ1 and ϕ2; (b) wrapped phase ϕ2 and unwrapped phase φ
    Fig. 1. Sketch maps of phase unwrapping. (a) Wrapped phases ϕ1 and ϕ2; (b) wrapped phase ϕ2 and unwrapped phase φ
    Unwrapped phases of 4 step method and 16 step method
    Fig. 2. Unwrapped phases of 4 step method and 16 step method
    Error of unwrapped phase of 4 step method
    Fig. 3. Error of unwrapped phase of 4 step method
    Mean filtering templates. (a) Normal 3×3 mean filtering template; (b) a kind of one-dimension mean filtering template; (c) mean filtering template to decrease phase error
    Fig. 4. Mean filtering templates. (a) Normal 3×3 mean filtering template; (b) a kind of one-dimension mean filtering template; (c) mean filtering template to decrease phase error
    New mean filtering templates. (a) Mean filtering template for head of each row of pixels; (b) mean filtering template for end of each row of pixels
    Fig. 5. New mean filtering templates. (a) Mean filtering template for head of each row of pixels; (b) mean filtering template for end of each row of pixels
    Experimental device and image collection. (a) Experimental device of structure light measurement; (b) projected fringes on background plane; (c) projected fringes on carton
    Fig. 6. Experimental device and image collection. (a) Experimental device of structure light measurement; (b) projected fringes on background plane; (c) projected fringes on carton
    Frequency spectra. (a) Frequency spectrum of phase error (displayed frequency range is 0--150); (b) frequency spectrum of unwrapped phase obtained by 4 step method (displayed frequency range is 0--150)
    Fig. 7. Frequency spectra. (a) Frequency spectrum of phase error (displayed frequency range is 0--150); (b) frequency spectrum of unwrapped phase obtained by 4 step method (displayed frequency range is 0--150)
    Phase error and restrained phase error of pixels in 100th row
    Fig. 8. Phase error and restrained phase error of pixels in 100th row
    Three dimensional (3D) point cloud measurement results (height from carton to reference plane). (a) 4 step method; (b) 4 step method with error compensation by LUT method; (c) 4 step method with phase error restraining; (d) 16 step method
    Fig. 9. Three dimensional (3D) point cloud measurement results (height from carton to reference plane). (a) 4 step method; (b) 4 step method with error compensation by LUT method; (c) 4 step method with phase error restraining; (d) 16 step method
    Cross sections of measured 3D point cloud (1500th row). (a) 4 step method; (b) 4 step method with phase error compensation by LUT method; (c) 4 step method with phase error restraining; (d) 16 step method
    Fig. 10. Cross sections of measured 3D point cloud (1500th row). (a) 4 step method; (b) 4 step method with phase error compensation by LUT method; (c) 4 step method with phase error restraining; (d) 16 step method
    Phase errorMaximum /radMinimum /radAverage error /(rad·pixel-1)
    Withoutphase error restraining0.2079-0.20760.1019
    1st restraining (T=84)0.0526-0.04880.0127
    2nd restraining (T=42)0.0471-0.05970.0075
    3rd restraining (T=28)0.0253-0.05480.0057
    Table 1. Experimental result of phase error restraining
    Experiment No.Average error /(rad·pixel-1)Decline rate/%
    Without error restrainingLUT methodProposed methodLUT methodProposed method
    0.09980.01790.003482.064196.5932
    0.10210.02030.005780.117594.4172
    0.10650.02310.008978.309991.6432
    0.10680.02180.004979.588091.6667
    0.10600.02110.007680.094392.8302
    Table 2. Statistics of results of 5 phase error restraining experiments
    Hui Jin, Ming Zhang, Guopeng Zhou, Xiao Xiao, Yutao Zhu. Phase Error Restraint Method for Fringe Projection Measurement System[J]. Laser & Optoelectronics Progress, 2021, 58(14): 1412001
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