• Laser & Optoelectronics Progress
  • Vol. 58, Issue 14, 1412001 (2021)
Hui Jin1、3, Ming Zhang1、*, Guopeng Zhou2、3, Xiao Xiao2、3, and Yutao Zhu3
Author Affiliations
  • 1School of Electronic and Electrical Engineering, Wuhan Textile University, Wuhan, Hubei 430200, China
  • 2Institute of Engineering & Technology, Hubei University of Science and Technology, Xianning, Hubei 437100, China;
  • 3Hubei Xiangcheng Intelligent Electromechanical Industry Technology Research Institute Limited Company, Xianning, Hubei 437100, China
  • show less
    DOI: 10.3788/LOP202158.1412001 Cite this Article Set citation alerts
    Hui Jin, Ming Zhang, Guopeng Zhou, Xiao Xiao, Yutao Zhu. Phase Error Restraint Method for Fringe Projection Measurement System[J]. Laser & Optoelectronics Progress, 2021, 58(14): 1412001 Copy Citation Text show less

    Abstract

    Aiming at the problem that the Gamma nonlinear effect of the projector and the camera will cause periodic errors in the unwrapping phase results, a phase error suppression method based on the mean template is proposed. First, Fourier transform is performed on the unwrapping phase to calculate the period value of the phase error. Then, a one-dimensional mean filter template with variable length is designed. The length of the template is related to the period of the phase error. Finally, this template is used to perform mean filtering on the unwrapping phase to eliminate periodic errors. Experimental results show that the proposed method reduces the periodic error of the unwrapping phase by an average of 94%, eliminates the distortion ripples that appear when measuring the depth information of flat objects with structured light, and improves the accuracy of phase measurement and depth information measurement without complex mathematical models and increasing fringe patterns. The proposed method is more suitable for practical applications.
    Hui Jin, Ming Zhang, Guopeng Zhou, Xiao Xiao, Yutao Zhu. Phase Error Restraint Method for Fringe Projection Measurement System[J]. Laser & Optoelectronics Progress, 2021, 58(14): 1412001
    Download Citation