Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Qingyang Du; Jérôme Michon; Bingzhao Li; Derek Kita; Danhao Ma; Haijie Zuo; Shaoliang Yu; Tian Gu; Anuradha Agarwal; Mo Li; Juejun Hu

doi:10.1364/PRJ.379019

Journals >Photonics Research >Volume 8 >Issue 2 >Page 186 > Article

Photonics Research
Vol. 8, Issue 2, 186 (2020)

Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Qingyang Du¹, Jérôme Michon¹, Bingzhao Li², Derek Kita¹, Danhao Ma¹, Haijie Zuo¹, Shaoliang Yu¹, Tian Gu¹, Anuradha Agarwal¹, Mo Li^2、3, and Juejun Hu^1、*

Author Affiliations

¹Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

²Department of Electrical and Computer Engineering, University of Washington, Seattle, Washington 98195, USA

³Department of Physics, University of Washington, Seattle, Washington 98195, USA

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DOI: 10.1364/PRJ.379019 Cite this Article Set citation alerts

Qingyang Du, Jérôme Michon, Bingzhao Li, Derek Kita, Danhao Ma, Haijie Zuo, Shaoliang Yu, Tian Gu, Anuradha Agarwal, Mo Li, Juejun Hu. Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips[J]. Photonics Research, 2020, 8(2): 186 Copy Citation Text

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