• Laser & Optoelectronics Progress
  • Vol. 55, Issue 11, 112801 (2018)
Dongmei Huang1, Jiheng Xu1, Wei Song1, Zhenhua Wang1, and Xiangfeng Liu2、*
Author Affiliations
  • 1 College of Information Technology, Shanghai Ocean University, Shanghai 201306, China
  • 2 Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    DOI: 10.3788/LOP55.112801 Cite this Article Set citation alerts
    Dongmei Huang, Jiheng Xu, Wei Song, Zhenhua Wang, Xiangfeng Liu. Comparison and Analysis of Gaussian Decomposition and Gaussian Wavelet Decomposition for GLAS Full Waveform Data[J]. Laser & Optoelectronics Progress, 2018, 55(11): 112801 Copy Citation Text show less

    Abstract

    Full waveform data decomposition is critical to obtain the effective information of tested object from the large-spot laser altimetry data. Gaussian decomposition and wavelet decomposition are two universal methods to achieve the full waveform data decomposition in the large-spot laser altimetry currently. However, the decomposition effect and accuracy are ambiguity for different echo signals of ground objects. In this paper, the two methods are applied to the full waveform data of the Geoscience Laser Altimeter System (GLAS), and the waveforms of several typical ground objects in flat and slop areas are decomposed. The results are analyzed and compared qualitatively and quantitatively according to the index of goodness-of-fit and the iteration times of achieving the best goodness-of-fit. The results show that the Gaussian decomposition and Guassian wavelet decomposition are nearly same for the accuracy of best goodness-of-fit. With the increase of the complexity of the ground objects, the iteration times of achieving the best goodness-of-fit with the Gaussian decomposition is less than that with the Gaussian wavelet decomposition.
    Dongmei Huang, Jiheng Xu, Wei Song, Zhenhua Wang, Xiangfeng Liu. Comparison and Analysis of Gaussian Decomposition and Gaussian Wavelet Decomposition for GLAS Full Waveform Data[J]. Laser & Optoelectronics Progress, 2018, 55(11): 112801
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