[1] Akahira N, Ohta T, Yamada N et al.. Sub-oxside thin films for an optical recording disk. Proc. SPIE, 1982, 329:195～201

[2] Kimura K. Optical recording materials based on TeOx films. Jpn. J. Appl. Phys., 1989, 28(5):810～813

[3] Takenaga M, Yamada N, Ohara S et al.. New optical erasable medium using tellurium suboxside thin film. Proc. SPIE, 1983, 420:173～177

[4] Nishiuchi K, Kitaura H, Yamada N et al.. Dual-layer optical disk with Te-O-Pd phase-change film. Jpn. J. Appl. Phys., 1998, 37(4B):2163～2167

[6] Terris B D, Mamin H J, Rugar D. Near-field data storage. Appl. Phys. Lett., 1996, 68(2):141～143

[7] Shintani T, Terao M, Yamamoto Y et al.. A new super-resolution film applicable to read-only and rewritable optical disks. Jpn. J. Appl. Phys., 1999, 38(3B):1656～1660

[9] Lee W Y, Sequeda F, Salem J et al.. Reactively sputter-deposited and coevaporated TeOx thin films for optical recording. J. Vac. Sci. Technol., 1986, A4(3):553～557