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    Journals >Opto-Electronic Engineering >Volume 46 >Issue 2 >Page 180219 > Article
    • Opto-Electronic Engineering
    • Vol. 46, Issue 2, 180219 (2019)
    Design and error analysis of multi-spectral and multi-axis parallelism testing scheme
    Huang Fuyu1、*, Li Gang1, Shi Yunsheng2, Zhang Xiaoliang1, Zou Changfan3, and Yu Ye3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.12086/oee.2019.180219 Cite this Article
    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219 Copy Citation Text show less
    References

    [5] Xiao Z J, Guo X X, Xia Y, et al. Research on detection system of optical sights triaxial parallelism[J]. Optik -International Journal for Light and Electron Optics, 2014, 125(16): 4427–4430.

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    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219
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