• Opto-Electronic Engineering
  • Vol. 46, Issue 2, 180219 (2019)
Huang Fuyu1、*, Li Gang1, Shi Yunsheng2, Zhang Xiaoliang1, Zou Changfan3, and Yu Ye3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.12086/oee.2019.180219 Cite this Article
    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219 Copy Citation Text show less

    Abstract

    The modular design and multi-channel integration has become the main thought of developing the pho-toelectric equipment, and the multi-axis parallelism directly influences the equipment performance. The current me-thods cannot meet the actual testing needs of multi-spectral, multi-axis, high-precise and large axis space. Thus a multi-spectral and multi-axis parallelism testing scheme is put forward by adopting the designing thought of reflective type and optical axis translation. The reflective collimator is designed to solve the multi-spectral and multi-axis par-allelism testing problems, and the optical axis translation design can increase the axis space of multi-axis parallelism test. The results show that the parallelism testing error is less than 0.134 mrad and the axis space can reach 0.5 m, which can satisfy parallelism testing needs of most photoelectric equipment.
    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219
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