• Journal of Semiconductors
  • Vol. 43, Issue 12, 122401 (2022)
Yueer Shan1, Zhengzhou Cao1、*, and Guozhu Liu2
Author Affiliations
  • 1East Technologies, Inc. Wuxi, Wuxi 214072, China
  • 2China Electronics Technology Group Corporation No. 58 Research Institute, Wuxi 214072, China
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    DOI: 10.1088/1674-4926/43/12/122401 Cite this Article
    Yueer Shan, Zhengzhou Cao, Guozhu Liu. Research on eigenstate current control technology of Flash-based FPGA[J]. Journal of Semiconductors, 2022, 43(12): 122401 Copy Citation Text show less
    References

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    [20] G Z Liu. Research on core configuration unit design and process integration technology of radiation-resistant FLASH-BASED FPGA. Doctoral Dissertation, Southeast University, 57(2020).

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    [22] G Z Liu, Z G Yu, Z Q Xiao et al. Reliable and radiation-hardened push-pull pFlash cell for reconfigured FPGAs. IEEE Trans Device Mater Relib, 21, 87(2021).

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    Yueer Shan, Zhengzhou Cao, Guozhu Liu. Research on eigenstate current control technology of Flash-based FPGA[J]. Journal of Semiconductors, 2022, 43(12): 122401
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