Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method

Xulei Lun; Dan Zhu; Zhishan Gao; Ningyan Xu; Wenyou Qiao; Qun Yuan

doi:10.3788/AOS221331

Journals >Acta Optica Sinica >Volume 43 >Issue 6 >Page 0612002 > Article

Acta Optica Sinica
Vol. 43, Issue 6, 0612002 (2023)

Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method

Xulei Lun, Dan Zhu, Zhishan Gao, Ningyan Xu, Wenyou Qiao, and Qun Yuan^*

Author Affiliations

School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu, China

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DOI: 10.3788/AOS221331 Cite this Article Set citation alerts

Xulei Lun, Dan Zhu, Zhishan Gao, Ningyan Xu, Wenyou Qiao, Qun Yuan. Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method[J]. Acta Optica Sinica, 2023, 43(6): 0612002 Copy Citation Text

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Xulei Lun, Dan Zhu, Zhishan Gao, Ningyan Xu, Wenyou Qiao, Qun Yuan. Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method[J]. Acta Optica Sinica, 2023, 43(6): 0612002

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