• Chinese Journal of Quantum Electronics
  • Vol. 27, Issue 5, 522 (2010)
Li-bing YOU1、*, Yi ZHOU2, Xu LIANG1, Yin-shan YU1, Xiao-dong FANG1, and Yu WANG2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    YOU Li-bing, ZHOU Yi, LIANG Xu, YU Yin-shan, FANG Xiao-dong, WANG Yu. Recent development of ArF excimer laser technology for lithography[J]. Chinese Journal of Quantum Electronics, 2010, 27(5): 522 Copy Citation Text show less

    Abstract

    193 nm ArF excimer laser lithography is widely used from below 90 nm node in semiconductor mass production. The key technologies recently employed to improve performance of ArF excimer lasers are analyzed, including master oscillator power regenerative amplifier (MOPRA) and master oscillator power oscillator (MOPO) configurations, active bandwidth stabilization technology, advanced gas management technology. Development trend of excimer laser technology for lithography is briefly discussed.
    YOU Li-bing, ZHOU Yi, LIANG Xu, YU Yin-shan, FANG Xiao-dong, WANG Yu. Recent development of ArF excimer laser technology for lithography[J]. Chinese Journal of Quantum Electronics, 2010, 27(5): 522
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