Principles to tailor the saturable and reverse saturable absorption of epsilon-near-zero material

Hao Ma; Yuanan Zhao; Yuchen Shao; Yafei Lian; Weili Zhang; Guohang Hu; Yuxin Leng; Jianda Shao

doi:10.1364/PRJ.417642

Journals >Photonics Research >Volume 9 >Issue 5 >Page 678 > Article

Photonics Research
Vol. 9, Issue 5, 678 (2021)

Principles to tailor the saturable and reverse saturable absorption of epsilon-near-zero material

Hao Ma^1、2、3, Yuanan Zhao^{1、2、3、*}, Yuchen Shao^1、2、3, Yafei Lian^1、2、3, Weili Zhang^1、2、3, Guohang Hu^1、2、3, Yuxin Leng⁴, and Jianda Shao^{1、2、3、5、6}

Author Affiliations

¹Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

³Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai 201800, China

⁴State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

⁵Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China

⁶e-mail: jdshao@siom.ac.cn

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DOI: 10.1364/PRJ.417642 Cite this Article Set citation alerts

Hao Ma, Yuanan Zhao, Yuchen Shao, Yafei Lian, Weili Zhang, Guohang Hu, Yuxin Leng, Jianda Shao. Principles to tailor the saturable and reverse saturable absorption of epsilon-near-zero material[J]. Photonics Research, 2021, 9(5): 678 Copy Citation Text

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$Characterization of as-deposited and annealed ITO films. SEM images showing (a) as-deposited ITO film and (b) ITO film annealed at 400˚C. (c) X-ray diffraction pattern. (d) Linear optical transmittance spectrum.$

Fig. 1. Characterization of as-deposited and annealed ITO films. SEM images showing (a) as-deposited ITO film and (b) ITO film annealed at 400˚C. (c) X-ray diffraction pattern. (d) Linear optical transmittance spectrum.

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Fig. 2. Real and imaginary components of the permittivity of ITO films. (a) As-deposited ITO film. (b) Post-annealed ITO film.

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Fig. 3. Optical nonlinear absorption measurement setup based on the Z-scan method.

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Fig. 4. Open aperture Z-scan results of as-deposited ITO films under excitation of 1030 nm at different input fluences.

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Fig. 5. Open aperture Z-scan results of as-deposited ITO films under excitation of 1440 nm at different input fluences. (a) OA Z-scan. (b) CA Z-scan.

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Fig. 6. Dependence of normalized transmittance of ITO films (as-deposited and annealed) on optical intensity using different pump sources. (a) 1030 nm. (b) 1440 nm.

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Fig. 7. Transient response of Te and Tl obtained using the two-temperature model under different pump fluences. (a) 1030 nm excitation. (b) 1440 nm excitation.

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Laser Intensity ( $GW / {cm}^{2}$ )	24.5	61.2	91.8	122.4	214.2
$I_{s}$ ( $GW / {cm}^{2}$ )	64.4	67.1	76.1	105.9	88.5
$γ$ ( ${cm}^{3} / {GW}^{2}$ )	$3.6 \times 10^{- 3}$	$6.0 \times 10^{- 3}$	$4.9 \times 10^{- 2}$	$6.1 \times 10^{- 2}$	$8.8 \times 10^{- 2}$