• Acta Optica Sinica
  • Vol. 41, Issue 12, 1229001 (2021)
Min Lu*, Zhile Wang, Shuqing Zhang, Pingping Gao, and Xiaobo He
Author Affiliations
  • Research Center for Space Optical Engineering, School of Astronautics, Harbin Institute of Technology, Harbin, Heilongjiang 150001, China
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    DOI: 10.3788/AOS202141.1229001 Cite this Article Set citation alerts
    Min Lu, Zhile Wang, Shuqing Zhang, Pingping Gao, Xiaobo He. Polarization Scattering Characterization and Discrimination Principle of Surface Defects[J]. Acta Optica Sinica, 2021, 41(12): 1229001 Copy Citation Text show less
    Schematic diagram of Mie scattering spatial relationship
    Fig. 1. Schematic diagram of Mie scattering spatial relationship
    Surface particle dust light diagram
    Fig. 2. Surface particle dust light diagram
    Surface dig light diagram
    Fig. 3. Surface dig light diagram
    Influence of different refractive indexes with three types of particle size on m33 values of particle contamination and dig. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Fig. 4. Influence of different refractive indexes with three types of particle size on m33 values of particle contamination and dig. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Influence of different real part of contamination refractive indexes with three types of different particle sizes on m33values of particle contamination. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Fig. 5. Influence of different real part of contamination refractive indexes with three types of different particle sizes on m33values of particle contamination. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Influence of different imaginary part of contamination refractive indexes with three types of particle size on m33values of particle contamination. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Fig. 6. Influence of different imaginary part of contamination refractive indexes with three types of particle size on m33values of particle contamination. (a) 1 μm; (b) 5 μm; (c) 10 μm
    Influence of D/λ on m33 values of particle contamination and dig. (a) D/λ=25/12; (b) D/λ=25/6; (c) D/λ=25/3
    Fig. 7. Influence of D/λ on m33 values of particle contamination and dig. (a) D/λ=25/12; (b) D/λ=25/6; (c) D/λ=25/3
    Influence of D/λ on absolute difference of Mueller values of particle contamination and dig. (a) Absolute difference of m12; (b) absolute difference of m33; (c) absolute difference of m34
    Fig. 8. Influence of D/λ on absolute difference of Mueller values of particle contamination and dig. (a) Absolute difference of m12; (b) absolute difference of m33; (c) absolute difference of m34
    Influence of incident angles on m33. (a) Particle contamination; (b) dig
    Fig. 9. Influence of incident angles on m33. (a) Particle contamination; (b) dig
    Influence of incident angles on absolute difference of Mueller values of particle contamination and dig. (a) Absolute difference of m12; (b) absolute difference of m33; (c) absolute difference of m34
    Fig. 10. Influence of incident angles on absolute difference of Mueller values of particle contamination and dig. (a) Absolute difference of m12; (b) absolute difference of m33; (c) absolute difference of m34
    Experimental schematic diagram
    Fig. 11. Experimental schematic diagram
    Comparison of simulation results with experimental results. (a) 20°; (b) 60°
    Fig. 12. Comparison of simulation results with experimental results. (a) 20°; (b) 60°
    Min Lu, Zhile Wang, Shuqing Zhang, Pingping Gao, Xiaobo He. Polarization Scattering Characterization and Discrimination Principle of Surface Defects[J]. Acta Optica Sinica, 2021, 41(12): 1229001
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