[1] 1241-2010, IEEE standard for terminology and test methods for analog-to-digital converters ［S］. IEEE, 2011.

[2] PETRICEVIC S J, MIHAILOVIC P, BARJAKTAROVIC M, et al. High input impedance ADC driver with error compensation ［C］// 29th MIEL. Belgrade, Serbia. 2014: 463-465.

[3] ZHOU G, WU J. Hardware design of data acquisition and processing of digital IF receiver ［C］// CECNet. Yichang, China. 2012: 2613-2615.

[4] PAWAR R R, WAGH P A, DEOSARKAR S B. Distribution transformer monitoring system using internet of things ［C］// ICCIDS. Chennai, India. 2017: 1-4.

[5] ZHANG Q, CHEN Y Z, SU Y, et al. A testing system for high speed multi-channel ADC with LVDS data output based on FPGA ［C］// ICSICT. Guilin, China. 2014: 1-3.

[6] BI S J, LV Y X. Analysis of sampling clock jitter effect on the SNR of two RF sampling receivers ［C］// ICCP. Jiuzhai, China. 2013: 394-397.