• Microelectronics
  • Vol. 52, Issue 2, 334 (2022)
ZHANG Lin1、2, QI Feitao1、2, LIU Tao1、2, ZHU Beili1、2, LIU Hainan1、2, TENG Rui1、2, LI Bo1、2, ZHAO Fazhan1、2, LUO Jiajun1、2, and HAN Zhengsheng1、2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.zjea015 Cite this Article
    ZHANG Lin, QI Feitao, LIU Tao, ZHU Beili, LIU Hainan, TENG Rui, LI Bo, ZHAO Fazhan, LUO Jiajun, HAN Zhengsheng. A Key Measurement Technique of High Speed ADC[J]. Microelectronics, 2022, 52(2): 334 Copy Citation Text show less

    Abstract

    The measurement techniques of high speed ADC were studied. A measurement scheme based on high speed ADC AD9433 was proposed. The principles of two kinds of analog input driving circuits were described systematically. Two analysis methods of analog driving circuit and clock circuit jitter were introduced in detail, The above theoretical analysis was applied to AD9433 measurement scheme. The measurement results proved the correctness of the above theoretical analysis.
    ZHANG Lin, QI Feitao, LIU Tao, ZHU Beili, LIU Hainan, TENG Rui, LI Bo, ZHAO Fazhan, LUO Jiajun, HAN Zhengsheng. A Key Measurement Technique of High Speed ADC[J]. Microelectronics, 2022, 52(2): 334
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