• Journal of Infrared and Millimeter Waves
  • Vol. 24, Issue 1, 23 (2005)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY,DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 23 Copy Citation Text show less
    References

    [1] EVANS C S, HUNNEMAN R,SEELEY J S. High-performance multilayer interference filters for the region 12-50 μm [J]. J. Phys. D: Appl. Phys. , 1976, 9: 309-320.

    [2] SEELEY J S, HUNNEMAN R, WHATLEY A. Far infrared filters for the Galileo-Jupiter and other missions [J]. Appl.Opt. , 1981, 20: 31-39.

    [3] SINHA N L P, CHAUDHURI A K, BOSE H N. Structural analysis of lead telluride films and their sensitization [J].Phys. Stat. Sol. (a), 1977, 44: K127-K129.

    [4] KOVALEV A N, KORABLEV V V. The depth profile of the elements in lead chalcogenide layers [J]. Thin Solid Films, 1988, 161: 281-287.

    [5] YEN Yi-Hsun, ZHU Ling-Xin, ZHANG Wen-De, ZHANG Feng-Shan, WANG Shou-Yin. Study of PbTe optical coatings [J]. Appl. Opt. , 1984, 23: 3597-3601.

    [6] LI Bin, JIANG Jin-Chun, ZHANG Su-Ying, ZHANG FengShan. Low-temperature dependence of mid-infrared optical constants of lead germanium telluride thin film [J]. J. Appl. Phys., 2002, 91: 3556-3561.

    [7] DALVEN R. A review of the semiconductor properties of PbTe, PbSe, PbS and PbO [J]. Infrared Phys. , 1969, 9:141-184.

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    [1] Zhang Lin, Ni Rong, Huang Chun, Li Bin, Liu Dingquan. Fabrication of a Narrow Bandpass Optical Filter with Central Wavelength at 14.95 μm[J]. Acta Optica Sinica, 2014, 34(7): 731003

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY,DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 23
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