• Journal of Infrared and Millimeter Waves
  • Vol. 24, Issue 1, 23 (2005)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY,DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 23 Copy Citation Text show less

    Abstract

    The characterizations of Te-rich PbTe layer thermal-evaporated from an excess of Te (<1 mol.%) evaporable materials were reported. The results reveal that the films obtained are polycrystalline and have single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the films have homogeneous surface morphology and homogeneous distribution of Te-rich components along the layer in the range of 170 nm. The study on mid-infrared optical constants of film surface-polished indicates that the influence of surface scattering on optical properties is very small.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY,DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 23
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